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METRIC+: A metamorphic relation identification technique based on input plus output domains

journal contribution
posted on 23.09.2020, 00:00 by C-A Sun, A Fu, Pak PoonPak Poon, X Xie, H Liu, TY Chen
Metamorphic testing is well known for its ability to alleviate the oracle problem in software testing. The main idea of metamorphic testing is to test a software system by checking whether each identified metamorphic relation (MR) holds among several executions. In this regard, identifying MRs is an essential task in metamorphic testing. In view of the importance of this identification task, METRIC (METamorphic Relation Identification based on Category-choice framework) was developed to help software testers identify MRs from a given set of complete test frames. However, during MR identification, METRIC primarily focuses on the input domain without sufficient attention given to the output domain, thereby hindering the effectiveness of METRIC. Inspired by this problem, we have extended METRIC into METRIC+ by incorporating the information derived from the output domain for MR identification. A tool implementing METRIC+ has also been developed. Two rounds of experiments, involving four real-life specifications, have been conducted to evaluate the effectiveness and efficiency of METRIC+. The results have confirmed that METRIC+ is highly effective and efficient in MR identification. Additional experiments have been performed to compare the fault detection capability of the MRs generated by METRIC+ and those by mMT (another MR identification technique). The comparison results have confirmed that the MRs generated by METRIC+ are highly effective in fault detection.

Funding

Other

History

Start Page

1

End Page

22

Number of Pages

22

eISSN

1939-3520

ISSN

0098-5589

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Additional Rights

CC BY 4.0

Peer Reviewed

Yes

Open Access

Yes

External Author Affiliations

Swinburne University of Technology; University of Science and Technology Beijing

Era Eligible

Yes

Journal

IEEE Transactions on Software Engineering