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Highly accurate time-of-flight measurement technique based on phase-correlation for ultrasonic ranging

journal contribution
posted on 2020-10-27, 00:00 authored by Mohammad KhyamMohammad Khyam, SS Ge, X Li, MR Pickering
Ultrasonic-based distance measurements using time-of-flight (TOF) is a fundamental technique for different applications across a wide variety of fields. In general, cross correlation between a transmitted and received signal is considered to be the optimal TOF estimation technique, which produces a peak at the time delay between them. Cross correlation provides a superior performance in conjunction with a linear chirp. However, as its accuracy depends on the width of the peak, which is inversely proportional to the signal's bandwidth, it can only be said to be highly accurate if the reflected signal at the receiver is separated in time by more than the width of the correlation peak; otherwise, errors are introduced into the system. To improve its accuracy, the bandwidth of the transmitted signal must be increased, which increases the system cost. In this paper, to solve this problem, a \text {threshold-based}\,\,\text {phase-correlation} technique is proposed, which is able to provide a much narrower peak than cross correlation without increasing the signal's physical bandwidth. To evaluate the proposed method, in a controlled environment, two experiments were performed under low and high multipath conditions. For an operational range of 600 mm (indoor), the root-mean-square errors were [0.10, 0.56] mm and [0.19, 1.19] mm for low and high multipath environments, respectively, which indicate that the proposed technique is precise enough to support high accuracy applications.

History

Volume

17

Issue

2

Start Page

434

End Page

443

Number of Pages

10

eISSN

1558-1748

ISSN

1530-437X

Publisher

Institute of Electrical and Electronics Engineers

Peer Reviewed

  • Yes

Open Access

  • No

Acceptance Date

2016-11-06

External Author Affiliations

University of New South Wales; Southeast University Nanjing, China; National University of Singapore

Era Eligible

  • Yes

Journal

IEEE Sensors Journal

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