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A simple method for evaluating flaw distributions responsible for size effects in the strength of small-scale silicon specimens

journal contribution
posted on 06.12.2017, 00:00 by Kai DuanKai Duan, X Hu
A simple means of deconvoluting the size distributions of fracture-controlling flaws from Weibull strength plots for small-scale specimens is proposed. The method makes use a power-law distribution function, empirical in form but self-consistent with a conventional two-parameter Weibull probability distribution. Literature data for single-crystal silicon beam specimens covering a range of widths from mm to nm are analyzed according to this procedure. The analysis indicates a reduction in scatter in addition to increase in strength with diminishing specimen size, and quantifies a systematic tightening in flaw distribution associated with refinement in fabrication method.

Funding

Category 1 - Australian Competitive Grants (this includes ARC, NHMRC)

History

Volume

312

Start Page

77

End Page

82

Number of Pages

6

ISSN

1013-9826

Location

Switzerland

Publisher

Trans Tech Publications Ltd.

Language

en-aus

Peer Reviewed

Yes

Open Access

No

External Author Affiliations

University of Western Australia;

Era Eligible

Yes

Journal

Key engineering materials.